Technology
MST - ReliabilityMST Extends the Life of Your Electronics
MST Improves Reliability
- MST can improve various wafer level reliability measures in nitrided oxide (PNO) planar devices, such as the time to dielectric breakdown (TDDB), the charge to dielectric breakdown (QBD), and PMOS negative bias temperature instability (NBTI). In HKMG devices, MST has also been observed to improve positive bias temperature instability (PBTI)
