Applications

Application

RF-SOI

Lower Ron·Coff, leakage and cleaner harmonics for RF switches — on thinner top silicon, in the same process flow.

MST for RF-SOI

RF-SOI switches and low-noise amplifiers sit in every phone's front end. Thinner top silicon and shorter gates cut off-capacitance, but the switch then loses breakdown voltage as its body pinches off.

A stack of MST layers traps boron right next to each layer, building a super-steep retrograde (SSRW) ground plane next to the buried oxide under a nearly undoped channel. It also holds back the lateral spread of the source/drain dopants. The switch gets thinner, smaller and faster without giving up breakdown.

The switch problem

Four numbers decide an RF switch

An RF switch is a stack of SOI FETs. On, it should look like a small resistor; off, like a small capacitor that holds the full RF swing without leaking or distorting.

Improving one of these numbers usually costs another — which is why Ron·Coff has improved only slowly from one RF-SOI generation to the next.

Switching efficiency

Ron·Coff

Insertion loss and isolation. Every femtosecond lets the designer shrink the switch or improve the RF path.

Off-state robustness

Body current, GIDL, BV

Stacked FETs must hold the RF voltage swing while off. Leakage and breakdown set the stack height and so the area.

Linearity

H2 / H3 harmonics

Antenna and tuning switches are checked for harmonics at high antenna-node stress.

Power handling

Pmax

Any gain in Ron·Coff must not cost power handling.

How MST helps

MST keeps the implanted Boron and Arsenic doping through downstream thermal processing

MST layers capture the silicon interstitials that carry boron and arsenic, so the doping set by implant survives the thermal budget of the whole flow.

In an RF-SOI switch that gives two things at once: a boron ground plane at the BOX that keeps breakdown up in a thinner film, and tighter source/drain junctions that cut the off-state capacitance.

At the BOX

boron ground plane held next to the buried oxide through the full thermal cycle (silicon + MSTcad™)

~25% lower R_DSON

at the same breakdown, measured on RF-SOI switches; or ~1 V more breakdown at the same R_DSON (silicon)

Lower C_OFF

farther-apart source/drain junctions: a better Ron·Coff (TCAD)

Boron ground plane kept next to the BOXSilicon + MSTcad™. Boron implanted after MST epi on thin SOI stays next to the buried oxide through the full thermal cycle; MSTcad™ reproduces the measured SIMS.
Lower C_OFF for a better Ron·CoffTCAD. MST holds back lateral diffusion of the source/drain and LDD dopants, so the junctions stay farther apart and C_OFF drops at the same gate and SOI thickness.
Performance gain, validated in siliconSilicon. Measured RF-SOI switches: R_DSON vs DC breakdown voltage.MST: ~25% lower R_DSON at the same DC breakdown, or ~1 V more breakdown at the same R_DSON.

Silicon data

MST delivers the gains on Silicon as predicted by MSTcad™ simulations

Lower Ron·Coff

at the same gate length, with much thinner top silicon

Lower body current (GIDL)

at the same switch area

Cleaner harmonics

less off-state second-harmonic distortion

Lower LNA power

the same gain at lower drain current

Roadmap fit

Additive to the rest of the RF-SOI roadmap

MST is an epitaxial film grown on the incoming SOI wafer. It needs no new fab line and no package change, and it adds to the other performance levers rather than replacing them.

3D-stacked RF-SOI

Stacking separates switch and PA/LNA dies to shrink the footprint. MST improves the switch and LNA devices inside the stack and enables the thinner films.

Strained top silicon

Strain raises mobility but makes boron up-diffusion harder to control. MST holds the boron in place and responds to strain like silicon.

LNA

Lower drain current at the same transconductance, with room to improve.

Contact us to learn more about what MST can do for your RF-SOI roadmap.

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Partner with Atomera

Evaluate MST in your own process and devices with Atomera's engineering team.

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