At December’s IEEE IEDM conference in San Francisco, Atomera held a very well attended event to discuss semiconductor variability and how to mitigate it. Three speakers gave very interesting talks including:
- Mitigation of Intrinsic Vt Variation using Oxygen Inserted (OI) Silicon Channel by Professor Suman Data – Frank M. Freimann Chair of Engineering at the University of Notre Dame
- Reducing Statistical Variability in Conventional “Bulk” CMOS by Professor Asen Asenov – James Watt Chair of Electrical Engineering at the University of Glasgow
- MST for Improved Variability by Dr. Robert J Mears founder and Chief Technical Officer of
